Method and device for measuring and optimising an optoelectronic component
The invention relates to a method for measuring at least one optoelectronic component (10) arranged on a connection carrier (100). The method comprises steps of exciting an electromagnetic oscillating circuit (38, 39), which is formed by the optoelectronic component (10) and the connection carrier (...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The invention relates to a method for measuring at least one optoelectronic component (10) arranged on a connection carrier (100). The method comprises steps of exciting an electromagnetic oscillating circuit (38, 39), which is formed by the optoelectronic component (10) and the connection carrier (100), thus exciting the optoelectronic component (10) in such a way that the optoelectronic component emits electromagnetic radiation (70), and measuring at least one electro-optical property of the optoelectronic component (10). |
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