Sensor performance on-line test device and method based on multi-threshold wavelet under strong interference

The invention relates to a sensor performance on-line test device and method based on a multi-threshold wavelet under strong interference. First, a test point environmental parameter signal detected by a sensor is subjected to filtering and collection; then the collected signal is subjected to noise...

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Bibliographische Detailangaben
Hauptverfasser: NI CE, XUE GUOWEI, FENG XINGLE, GAO TAO, WU XIAOLONG, CHENG FEI
Format: Patent
Sprache:eng
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Zusammenfassung:The invention relates to a sensor performance on-line test device and method based on a multi-threshold wavelet under strong interference. First, a test point environmental parameter signal detected by a sensor is subjected to filtering and collection; then the collected signal is subjected to noise reduction processing through fuzzy multi-threshold wavelet transformation; wavelet decomposition is carried out, wavelet coefficients are obtained, the membership degree of each wavelet coefficient is obtained, the wavelet coefficients with the membership degrees exceeding the preset threshold are rejected, wavelet reconstruction is carried out by utilization of the wavelet coefficients with the membership degrees within the preset threshold, detection data after noise reduction is obtained, sensor characteristic indexes are calculated according to the detection data after noise reduction and environmental parameter values of the test point, and sensor performance on-line automatic test is finished. Noise reduction processing is carried out with combination of filtering and fuzzy multi-threshold wavelet transformation, the signal outline after noise reduction is obvious and clear, no detail signals are lost, fidelity with an original signal is kept, and the signal to noise ratio of the signal is raised obviously.