Semiconductor device, manufacturing method thereof, and manufacturing apparatus thereof
The invention provides a semiconductor device capable of preventing characteristic change of an oxide semiconductor and having smaller parasitic capacitance, the manufacturing method thereof, and the manufacturing apparatus thereof. In a laminated TFT (10) formed by laminating a gate electrode (12),...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!