Device and method for statically sampling deep layers of grain piles

The invention discloses a device and a method for statically sampling deep layers of grain piles. The device for statically sampling the deep layers of the grain piles mainly comprises a rotating joint, an intermediate tube and a sampling head which are connected with one another by rectangular thre...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HE BO, LAN SHENGBIN, ZHANG JUAN, DONG DELIANG, YAN XIAOPING, GONG LINJUN
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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