Microwave automatic test system calibration method based on scattering parameter cascading

The invention provides a microwave automatic test system calibration method based on scattering parameter cascading, comprising the following steps: determining all test channels contained in calibration and test and basic composition units of each test channel according to the specific test application state, and performing corresponding multidimensional condition mapping scattering parameter calibration data configuration; making a system configure test instruments and equipment for self-calibration according to specific test application configuration information; and performing test application of a microwave automatic test system according to specific test application requirements when calibration data configuration is completed, and correcting error in real time according to calibration data to obtain a test result with high test accuracy. By adopting the method, the problem that test accuracy decrease and test failure are caused by limited self-calibration test performance of a universal test instrument due to a complex test channel, irregular requirements and other reasons in the automatic test process is solved effectively.