Sorting machine for testing semiconductor elements, and operation method thereof
The present invention discloses a sorting machine for testing produced semiconductor elements, wherein the semiconductor elements are electrically connected to a tester side. By means of the sorting machine, at least one portion of all operations on a manipulator is renewed. In this way, an impact i...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The present invention discloses a sorting machine for testing produced semiconductor elements, wherein the semiconductor elements are electrically connected to a tester side. By means of the sorting machine, at least one portion of all operations on a manipulator is renewed. In this way, an impact is applied on a test tray, and abnormally placed semiconductor elements are guided to be correctly and properly seated. The manipulator is used for manipulating a latch member of an insert on the test tray. Therefore, the manual operation of administrators is greatly reduced, and the operation efficiency of the sorting machine is improved. |
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