Measuring method and measuring device

A measuring unit (301) acquires measurement data for a plurality of lines by repeatedly executing, on a reference tire, a measurement process to acquire measurement data for one line. A first acquisition unit (311) generates height data for one line for each of the plurality of sets of measurement d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HUANG MUYAO, TAKAHASHI EIJI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A measuring unit (301) acquires measurement data for a plurality of lines by repeatedly executing, on a reference tire, a measurement process to acquire measurement data for one line. A first acquisition unit (311) generates height data for one line for each of the plurality of sets of measurement data measured by the measuring unit (301), arranges the generated plurality of values of one-dimensional height data into a matrix form, generates two-dimensional height data for the measured face, and generates reference shape data. A second acquisition unit (314) acquires object one-dimensional height data from one-line shape data measured by the measuring unit (301) for the object tire. The measuring method and measuring device are characterized in that a removal unit (315) compares the object one-dimensional height data and the one-dimensional height data of the reference shape data at the same position in the sub-scan direction for the object one-dimensional height data, and removes, from the object one-dimensional height data, the height component of the projection.