1-Wire bus temperature measurement circuit DS18B20 single event effect evaluation system and method

1-Wire bus temperature measurement circuit DS18B20 single event effect evaluation system and method

A 1-Wire bus temperature measurement circuit DS18B20 single event effect evaluation system comprises a computer, a programmable power supply, a control board, a test board and related cables, wherein the programmable power supply, the test board and the control board are placed in a single event eff...

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Bibliographische Detailangaben
Hauptverfasser: KUANG QIANWEI, NING YONGCHENG, ZHANG SONG, WANG MO, YUAN CHUNZHU, FU DANYING, CHEN LUOJING, CONG SHAN, WANG HE
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Beschreibung
Zusammenfassung:A 1-Wire bus temperature measurement circuit DS18B20 single event effect evaluation system comprises a computer, a programmable power supply, a control board, a test board and related cables, wherein the programmable power supply, the test board and the control board are placed in a single event effect test environment; the test board is arranged at the near end of a beam current source; and the computer is arranged outside the single event test environment and remotely controls work of the programmable power supply and the control board via a USB bus and an UART bus.