Quality control method by means of test data

The invention discloses a quality control method by means of test data. A wafer is divided into a plurality of elements to be tested, electrical characteristic and efficacy of each element to be tested are tested through the wafer test, a collecting unit collects the batch number of the wafer, the m...

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Bibliographische Detailangaben
1. Verfasser:	CHEN KUNZHONG
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
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Beschreibung
Zusammenfassung:	The invention discloses a quality control method by means of test data. A wafer is divided into a plurality of elements to be tested, electrical characteristic and efficacy of each element to be tested are tested through the wafer test, a collecting unit collects the batch number of the wafer, the model number of the wafer, the coordinate of each element to be tested on the wafer, the number of each element to be tested, the test parameter of each element to be tested, and test result data after the wafer test of the wafer, and the above data is sent to a test data analysis station for analysis, a normal distribution diagram of collected data is manufactured based on the data, the difference and standard deviation are worked out, and the difference and standard deviation can be used as a quality controlling and monitoring method or can be used for analyzing the stability of the test program.