Failure testing circuit and method of power device

Failure testing circuit and method of power device

The invention discloses a failure testing circuit and method of a power device. The failure testing circuit comprises a first switch, a second switch and a controller. The first switch is connected with the tested device in series, and the first switch and the tested device form a first conducting b...

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Hauptverfasser: YU WEI, LUO HAIHUI, HUANG JIANWEI, LIU GUOYOU, TAN RONGZHEN, ZHU LIHENG
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator YU WEI
LUO HAIHUI
HUANG JIANWEI
LIU GUOYOU
TAN RONGZHEN
ZHU LIHENG
description The invention discloses a failure testing circuit and method of a power device. The failure testing circuit comprises a first switch, a second switch and a controller. The first switch is connected with the tested device in series, and the first switch and the tested device form a first conducting branch circuit; the second switch is connected with the first conducting branch circuit in parallel; the controller is connected with the first switch and the second switch and used for turning on the first switch and turning off the second switch or turning off the first switch and turning on the second switch according to a detected status signal of the tested device. By means of the failure testing circuit and method, when the tested device fails, a bypass can be switched on in time to dredge current, and therefore it is avoided that the tested device is attacked by large current after failing.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Failure testing circuit and method of power device
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