Failure testing circuit and method of power device
The invention discloses a failure testing circuit and method of a power device. The failure testing circuit comprises a first switch, a second switch and a controller. The first switch is connected with the tested device in series, and the first switch and the tested device form a first conducting b...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The invention discloses a failure testing circuit and method of a power device. The failure testing circuit comprises a first switch, a second switch and a controller. The first switch is connected with the tested device in series, and the first switch and the tested device form a first conducting branch circuit; the second switch is connected with the first conducting branch circuit in parallel; the controller is connected with the first switch and the second switch and used for turning on the first switch and turning off the second switch or turning off the first switch and turning on the second switch according to a detected status signal of the tested device. By means of the failure testing circuit and method, when the tested device fails, a bypass can be switched on in time to dredge current, and therefore it is avoided that the tested device is attacked by large current after failing. |
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