Analytical method for measuring impurity content in tin sample

The invention belongs to the technical field of test analysis and discloses an analytical method for measuring impurity content in a tin sample. The analytical method for measuring the impurity content in the tin sample is used for measuring such impurities as Fe, Cu, Ni, Cr, Ti, Mg, Al and Mn; the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHOU LI, ZHAO HUIFENG, WU QINGJIAN, LI XIAOGUI, LYU HAO, WANG YEXING
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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