Stress-strain test method, device and system

The invention discloses a stress-strain test method, device and system, wherein the system comprises an instruction emission circuit connected between a control circuit and tested equipment and used for emitting a control instruction for running at a target frequency, a frequency acquisition circuit connected between the control circuit and the tested equipment and used for acquiring a running frequency of the tested equipment in real time, a control circuit used for starting a stress-strain acquisition device when the running frequency is equal to the target frequency, and the stress-strain acquisition device connected between the control circuit and the tested equipment and used for acquiring initial stress-strain values of the tested equipment every a preset time; the control circuit is used for taking a maximum value in the initial stress-strain values as a stress-strain value of the tested equipment at the target frequency. With the adoption of the stress-strain test method, device and system, problems of inaccuracy for stress-strain testing and low efficiency in the prior art are solved and an effect of accurately, stably and quickly obtaining the stress-strain value is achieved.