Vernier type comprehensive gauge for hole

The invention discloses a vernier type comprehensive gauge for a hole. The vernier type comprehensive gauge comprises a gauge body with scale marks, a handle reference block, a vernier and an aperture measurement mechanism arranged on the gauge body, wherein an inner sliding cavity of which the two ends are open is formed in the handle reference block; the gauge body is adaptively arranged in the inner sliding cavity in a sliding penetration manner; the scale marks are axially arranged on the gauge body; a vernier embedding opening communicated with the inner sliding cavity is further formed in the circumferential surface of the handle reference block; the vernier is embedded into the vernier embedding opening; the aperture measurement mechanism comprises an aperture measurement main scale, a pair of radial verniers and a pair of internal diameter clamping legs; a radially through notch is formed between the two ends of the gauge body; the aperture measurement main scale is arranged in the notch in a penetration manner, exposed to the two sides of the notch, and perpendicular to the axis of the gauge body; the two radial verniers are connected to the aperture measurement main scale in a sliding manner, and are symmetrically distributed on the two sides of the axis of the gauge body. According to the vernier type comprehensive gauge, aperture and hole depth measurement accuracy can be improved, the vernier type comprehensive gauge is convenient to use, and working efficiency can be obviously improved.