Chip testing method

The invention discloses a chip testing method which is characterized by simultaneously testing different varieties or types of chips on the same silicon wafer by using DFM (Data Failure Memory) resource of an SOC (System on Chip) tester. The chip testing method comprises the following steps of carry...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SUN LIJIN
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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