System and method for correcting correction factors of near field probe by utilizing microstrip line method

The invention discloses a system and method for correcting the correction factors of a near field probe by utilizing a microstrip line method. The system comprises a microstrip line placed on a microstrip line substrate, an adjustable signal source, a spectrum analyzer, a near field probe, a load terminal and a data processing unit connected with the spectrum analyzer, wherein the near field probe is placed above the microstrip line to be used for detecting signals sent by the adjustable signal source to the load terminal through the microstrip line; the spectrum analyzer is used for being connected with the microstrip line and used for measuring the voltage value of signals sent by the adjustable signal source to the spectrum analyzer through the microstrip line; the spectrum analyzer is also used for being connected with the near field probe to be used for measuring the voltage value of signals detected by the near field probe. The technical scheme adopted by the system disclosed by the invention lies in that a near field which is generated by the microstrip line and is close to an actual test is adopted to correct the correction factors of the near field probe under correction frequency points, and the preparation for utilizing the corrected correction factors to correct a microstrip-line radiation field in a correction test is well provided, so that the accuracy of measurement data is improved.