Device and method for testing aging of multi-key input function of electronic device

The invention provides a device and method for testing aging of a multi-key input function of an electronic device. The device and method are used for testing aging of the simultaneous multi-key input function of the electronic device. The aging testing device comprises a controller and at least one programmable power supply. Each programmable power supply is provided with multiple power supply output ports used for being connected to multiple key ports, corresponding to multiple keys, of the electronic device respectively. The controller is used for controlling the multiple power supply output ports to output level signals corresponding to the aging test items of the power supply output ports a preset number of times. When the device and method are used for aging tests, labor investment can be reduced, and hardware parts and software parts of the electronic device can be tested at the same time.