Calibration device for capacitor instant open/short circuit tester and calibration method
The invention discloses a calibration device for a capacitor instant open/short circuit tester and a calibration method. The calibration device comprises a capacitor (3), wherein a collector of an NPN type triode transistor (1) and an emitter of a PNP type triode transistor (2) are in short circuit...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The invention discloses a calibration device for a capacitor instant open/short circuit tester and a calibration method. The calibration device comprises a capacitor (3), wherein a collector of an NPN type triode transistor (1) and an emitter of a PNP type triode transistor (2) are in short circuit connection and then led to a terminal B; the capacitor (3) is connected in series between the terminal B and the emitter of the PNP type triode transistor (2); an emitter of the NPN type triode transistor (1) and a collector of the PNP type diode transistor (2) are in short circuit connection and then connected to a ground terminal GND; a base electrode of the NPN type triode transistor (1) is connected to a terminal A; a base electrode of the PNT type triode transistor (2) is connected to a terminal C. The calibration device disclosed by the invention solves the problems that in the prior art, the capacitor instant open/short circuit tester cannot be calibrated by a dedicated standard instrument capable of simulating the open circuit or the short circuit, and difficulty exists in calibrating the capacitor instant open/short circuit tester. |
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