Cobalt (co) and platinum (pt)-based multilayer thin film having inverted structure and method for manufacturing same

The present invention relates to a cobalt (Co) and platinum (Pt)-based multilayer thin film having a novel structure with perpendicular magnetic anisotropy and to a method for manufacturing same. More particularly, the present invention relates to a perpendicular magnetic anisotropic (PMA) multilaye...

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Bibliographische Detailangaben
Hauptverfasser:	SON DONG-SU, LEE TAE-YOUNG, LIM SANG-HO, LEE SEONG-RAE
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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