Method for sampling far-field pattern for diagnosing failure array elements of array antenna

The invention provides a method for sampling a far-field pattern for diagnosing failure array elements of an array antenna. The method comprises the following concrete steps that: the work states of the array elements in the array antenna are divided into a work state and a non-work state; a GA (Gen...

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Hauptverfasser: HUANG WANJING, LUO WUQIONG, XU XIN, TANG QINGWU, MIAO JING, DU XINGXING, JIANG YUANJUN, CHEN BO, CHEN SIXU
Format: Patent
Sprache:eng
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Zusammenfassung:The invention provides a method for sampling a far-field pattern for diagnosing failure array elements of an array antenna. The method comprises the following concrete steps that: the work states of the array elements in the array antenna are divided into a work state and a non-work state; a GA (Genetic Algorithm) is used for coding the state; and an objective function is built for expressing differences between a pattern obtained through calculation and a pattern obtained through measurement in different coding states. The GA is used for optimizing the objective function to reach the maximum value. The condition of the minimum differences between the pattern obtained through calculation and the pattern obtained through measurement is calculated under different array element work state configuration. An extracted parameter S of the array is used and is added into the calculation of the array pattern in the calculation, and the influence of a mutual coupling effect is considered. The diagnosis success rate is improved.