Semiconductor measuring device

The invention relates to a semiconductor measuring device. The semiconductor measuring device comprises at least one sensor for detecting onsite parameters, and a microcontroller in communication connection with the at least one sensor, wherein the microcontroller supports a wireless communication p...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	GUO YAJUAN, GUO YIMING, ZHOU WANQUAN
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a semiconductor measuring device. The semiconductor measuring device comprises at least one sensor for detecting onsite parameters, and a microcontroller in communication connection with the at least one sensor, wherein the microcontroller supports a wireless communication protocol, and the sensor communicates with the microcontroller through the wireless communication protocol so as to acquire sensor data at each position of the sensor measuring device. According to the invention, the semiconductor measuring device employs the wireless communication protocol to replace a conventional wired cable, such that the structural complexity of the semiconductor measuring device is greatly reduced, networking is facilitated, replacement of a fault component can be realized in a quite simple manner in case that a fault is generated at a certain sensor, and the complex wiring problem does not have to be involved.