Control system of industrial CT

Control system of industrial CT

The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process c...

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Hauptverfasser: HUANG QINGTAN, TAN HUI, REN ZICHENG, LIU RONG, YAO BIJI, WANG HAIBIN, YE FEI, YUAN GUXING
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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creator HUANG QINGTAN
TAN HUI
REN ZICHENG
LIU RONG
YAO BIJI
WANG HAIBIN
YE FEI
YUAN GUXING
description The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process configuration. The bottom master controller is used for completing ray source translational motion control, detector translational motion control, precision unit work piece rotary motion control, ray source synchronization control, detector synchronization control and safety interlocking control, and receiving control of a field HMI. The bottom slave controller I is responsible for interpolation motion control, layer thickness adjusting control, collimator selection control, defect marking device motion control and marking control. The bottom slave controller II is responsible translational motion control on a standard unit access detection chamber, work piece rotary motion control on a standard unit, work piece deflection motion control on the standard unit, and clamping action control on a clamp of the standard unit. Standard assembly line scanning and configuration assembly line scanning can be carried out, and the detection efficiency is effectively improved.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN104331019A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN104331019A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN104331019A3</originalsourceid><addsrcrecordid>eNrjZJB3zs8rKcrPUSiuLC5JzVXIT1PIzEspLS4pykzMUXAO4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgYmxsaGBoaWjsbEqAEAGS4kow</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Control system of industrial CT</title><source>esp@cenet</source><creator>HUANG QINGTAN ; TAN HUI ; REN ZICHENG ; LIU RONG ; YAO BIJI ; WANG HAIBIN ; YE FEI ; YUAN GUXING</creator><creatorcontrib>HUANG QINGTAN ; TAN HUI ; REN ZICHENG ; LIU RONG ; YAO BIJI ; WANG HAIBIN ; YE FEI ; YUAN GUXING</creatorcontrib><description>The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process configuration. The bottom master controller is used for completing ray source translational motion control, detector translational motion control, precision unit work piece rotary motion control, ray source synchronization control, detector synchronization control and safety interlocking control, and receiving control of a field HMI. The bottom slave controller I is responsible for interpolation motion control, layer thickness adjusting control, collimator selection control, defect marking device motion control and marking control. The bottom slave controller II is responsible translational motion control on a standard unit access detection chamber, work piece rotary motion control on a standard unit, work piece deflection motion control on the standard unit, and clamping action control on a clamp of the standard unit. Standard assembly line scanning and configuration assembly line scanning can be carried out, and the detection efficiency is effectively improved.</description><language>eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150204&amp;DB=EPODOC&amp;CC=CN&amp;NR=104331019A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20150204&amp;DB=EPODOC&amp;CC=CN&amp;NR=104331019A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG QINGTAN</creatorcontrib><creatorcontrib>TAN HUI</creatorcontrib><creatorcontrib>REN ZICHENG</creatorcontrib><creatorcontrib>LIU RONG</creatorcontrib><creatorcontrib>YAO BIJI</creatorcontrib><creatorcontrib>WANG HAIBIN</creatorcontrib><creatorcontrib>YE FEI</creatorcontrib><creatorcontrib>YUAN GUXING</creatorcontrib><title>Control system of industrial CT</title><description>The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process configuration. The bottom master controller is used for completing ray source translational motion control, detector translational motion control, precision unit work piece rotary motion control, ray source synchronization control, detector synchronization control and safety interlocking control, and receiving control of a field HMI. The bottom slave controller I is responsible for interpolation motion control, layer thickness adjusting control, collimator selection control, defect marking device motion control and marking control. The bottom slave controller II is responsible translational motion control on a standard unit access detection chamber, work piece rotary motion control on a standard unit, work piece deflection motion control on the standard unit, and clamping action control on a clamp of the standard unit. Standard assembly line scanning and configuration assembly line scanning can be carried out, and the detection efficiency is effectively improved.</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB3zs8rKcrPUSiuLC5JzVXIT1PIzEspLS4pykzMUXAO4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgYmxsaGBoaWjsbEqAEAGS4kow</recordid><startdate>20150204</startdate><enddate>20150204</enddate><creator>HUANG QINGTAN</creator><creator>TAN HUI</creator><creator>REN ZICHENG</creator><creator>LIU RONG</creator><creator>YAO BIJI</creator><creator>WANG HAIBIN</creator><creator>YE FEI</creator><creator>YUAN GUXING</creator><scope>EVB</scope></search><sort><creationdate>20150204</creationdate><title>Control system of industrial CT</title><author>HUANG QINGTAN ; TAN HUI ; REN ZICHENG ; LIU RONG ; YAO BIJI ; WANG HAIBIN ; YE FEI ; YUAN GUXING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN104331019A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2015</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG QINGTAN</creatorcontrib><creatorcontrib>TAN HUI</creatorcontrib><creatorcontrib>REN ZICHENG</creatorcontrib><creatorcontrib>LIU RONG</creatorcontrib><creatorcontrib>YAO BIJI</creatorcontrib><creatorcontrib>WANG HAIBIN</creatorcontrib><creatorcontrib>YE FEI</creatorcontrib><creatorcontrib>YUAN GUXING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG QINGTAN</au><au>TAN HUI</au><au>REN ZICHENG</au><au>LIU RONG</au><au>YAO BIJI</au><au>WANG HAIBIN</au><au>YE FEI</au><au>YUAN GUXING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Control system of industrial CT</title><date>2015-02-04</date><risdate>2015</risdate><abstract>The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process configuration. The bottom master controller is used for completing ray source translational motion control, detector translational motion control, precision unit work piece rotary motion control, ray source synchronization control, detector synchronization control and safety interlocking control, and receiving control of a field HMI. The bottom slave controller I is responsible for interpolation motion control, layer thickness adjusting control, collimator selection control, defect marking device motion control and marking control. The bottom slave controller II is responsible translational motion control on a standard unit access detection chamber, work piece rotary motion control on a standard unit, work piece deflection motion control on the standard unit, and clamping action control on a clamp of the standard unit. Standard assembly line scanning and configuration assembly line scanning can be carried out, and the detection efficiency is effectively improved.</abstract><oa>free_for_read</oa></addata></record>
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title Control system of industrial CT
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