Control system of industrial CT

The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HUANG QINGTAN, TAN HUI, REN ZICHENG, LIU RONG, YAO BIJI, WANG HAIBIN, YE FEI, YUAN GUXING
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:The invention discloses a control system of an industrial CT, comprising an upper controller, a bottom master controller, a bottom slave controller I and a bottom slave controller II. The upper controller is used for scanning mode selection, scanning parameter setting, scanning control and process configuration. The bottom master controller is used for completing ray source translational motion control, detector translational motion control, precision unit work piece rotary motion control, ray source synchronization control, detector synchronization control and safety interlocking control, and receiving control of a field HMI. The bottom slave controller I is responsible for interpolation motion control, layer thickness adjusting control, collimator selection control, defect marking device motion control and marking control. The bottom slave controller II is responsible translational motion control on a standard unit access detection chamber, work piece rotary motion control on a standard unit, work piece deflection motion control on the standard unit, and clamping action control on a clamp of the standard unit. Standard assembly line scanning and configuration assembly line scanning can be carried out, and the detection efficiency is effectively improved.