Device and method for testing microwave surface resistance distribution of high-temperature superconducting thin film

The invention discloses a device and method for testing the microwave surface resistance distribution of a high-temperature superconducting thin film. The testing device comprises a testing seat, a fixing assembly, a calibration assembly and a sealing cover, and the working resonant mode is TE012. The testing seat comprises a shielding shell, an input coupling structure, an output coupling structure, a supporting ring, a dielectric cylinder and a metal circular ring. The testing seat is loaded with the tested superconducting thin film to constitute a resonator. The fixing assembly is used for fixing the tested superconducting thin film, and the sealing cover is used for isolating the inside and the outside of the resonator. The device and method for testing the microwave surface resistance distribution of the high-temperature superconducting thin film have the advantages that the contradiction among the resolution ratio, the sensitivity and the universality of the testing device in the microwave surface resistance distribution test of the superconducting thin film is solved; the tested superconducting thin film can be effectively prevented from being pressed to be damaged; direct coupling can be effectively avoided, and high testing precision is achieved.