TESTING APPARATUS AND RELATIVE METHOD

Embodiments of the invention may provide a testing apparatus that is used to test solar cells or other electronic devices. The testing apparatus may comprise a substantially flat support (18) that is configured to support a substrate (150) or other device that is to be electrically tested and a plur...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	VAZZOLER MICHELE
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	Embodiments of the invention may provide a testing apparatus that is used to test solar cells or other electronic devices. The testing apparatus may comprise a substantially flat support (18) that is configured to support a substrate (150) or other device that is to be electrically tested and a plurality of testing probes. The support comprises a plurality of through holes (23), each suitable for the insertion of a corresponding testing probe (42), to allow each probe to make contact with a testing area formed on the substrate (150). The testing apparatus may comprise a plurality of suction holes (24) surrounding each through holes (23).