Method for measuring contents of silicon, calcium and aluminum in additives and co-solvents of permanent magnetic ferrites through ICP (Inductively Coupled Plasma) emission spectroscopy

The invention relates to a method for measuring contents of silicon, calcium and aluminum in additives and co-solvents of permanent magnetic ferrites through an ICP (Inductively Coupled Plasma) emission spectroscopy. The method comprises the following steps: adding concentrated hydrochloric acid and...

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Hauptverfasser: CHEN TAO, YUE JINLING, TAO JUN, ZHAO SUI
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a method for measuring contents of silicon, calcium and aluminum in additives and co-solvents of permanent magnetic ferrites through an ICP (Inductively Coupled Plasma) emission spectroscopy. The method comprises the following steps: adding concentrated hydrochloric acid and concentrated nitric acid into a sample to be detected to be dissolved at the low temperature, then preparing a solution in a 100mL volumetric flask with constant volume and shaking uniformly for detection; making a working curve with corresponding spectral line intensities and mass fractions of silicon, calcium and aluminum in a plasma atom emission spectrograph by using prepared standard solutions of silicon, calcium and aluminum, analyzing the sample to be detected by using the curve to obtain contents of silicon, calcium and aluminum in additives and co-solvents of the permanent magnetic ferrites. The analysis method is few in chemical reagents, little in environment pollution, low in analysis cost, capable of