Experimental facility used for high-low temperature optical evaluation
The invention discloses an experimental facility used for high-low temperature optical evaluation. The experimental facility comprises a sealed box, a sample platform deck, a temperature sensor, a heat-carrying gas inlet channel, a heat-carrying gas overflow channel and an optical test probe, wherei...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses an experimental facility used for high-low temperature optical evaluation. The experimental facility comprises a sealed box, a sample platform deck, a temperature sensor, a heat-carrying gas inlet channel, a heat-carrying gas overflow channel and an optical test probe, wherein the sample platform deck is arranged inside the sealed box and used for placement of test samples, the temperature sensor is arranged above the sample platform deck and used for measuring temperature in the sealed box, the heat-carrying gas inlet channel is arranged on one side wall of the sealed box and used for leading in heat-carrying gas, the heat-carrying gas overflow channel is arranged on the other side wall of the sealed box and used for exhausting the redundant heat-carrying gas, and the optical test probe is arranged outside the sealed box, located above the sample platform deck, and used for measuring optical performance parameters of the test samples. The specific heat capacity of the heat-carrying ga |
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