Method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry
The invention relates to a method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry. The method is as follows: measuring 100 ml of normal hexane and 20 ml diethyl ether to dilute 1.0 ml of the triethyl aluminum; adding 20ml of 20% sulfuric acid, releasing a lower-la...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention relates to a method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry. The method is as follows: measuring 100 ml of normal hexane and 20 ml diethyl ether to dilute 1.0 ml of the triethyl aluminum; adding 20ml of 20% sulfuric acid, releasing a lower-layer acid liquid, respectively using 20ml of the 20% sulfuric acid and 20ml of deionized water for extraction for one time, collecting a lower-layer extract; putting the extract on an electric heating plate for heating at 100-200 DEG C until a lot of white smoke of sulfur trioxide is emitted, using the deionized water to dilute and fix to a constant volume to be measured; and using the plasma emission spectrometry to detect the obtained aluminum-containing sample solution, and automatically calculating the aluminum content in the triethyl aluminum sample according to a standard curve; the aluminum content in the triethyl aluminum can be calculated by use of the following formula X = C * V1/V2; the method is simple, |
---|