Method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry

The invention relates to a method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry. The method is as follows: measuring 100 ml of normal hexane and 20 ml diethyl ether to dilute 1.0 ml of the triethyl aluminum; adding 20ml of 20% sulfuric acid, releasing a lower-la...

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Hauptverfasser: LIU CHANGFU, GAO WENLI, SHAO WEI, RONG LILI, LI QUNYING, ZHANG YAN, HAN YANNAN, LI GUOQING, LIANG ZHONGYUE, WANG GUIZHI, ZHANG CHUNYAN, SUN LING
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a method for detecting aluminum content in triethyl aluminum by plasma emission spectrometry. The method is as follows: measuring 100 ml of normal hexane and 20 ml diethyl ether to dilute 1.0 ml of the triethyl aluminum; adding 20ml of 20% sulfuric acid, releasing a lower-layer acid liquid, respectively using 20ml of the 20% sulfuric acid and 20ml of deionized water for extraction for one time, collecting a lower-layer extract; putting the extract on an electric heating plate for heating at 100-200 DEG C until a lot of white smoke of sulfur trioxide is emitted, using the deionized water to dilute and fix to a constant volume to be measured; and using the plasma emission spectrometry to detect the obtained aluminum-containing sample solution, and automatically calculating the aluminum content in the triethyl aluminum sample according to a standard curve; the aluminum content in the triethyl aluminum can be calculated by use of the following formula X = C * V1/V2; the method is simple,