Method for determining concentration of cerium ions in cerium-doped scintillation crystal
The invention relates to a method for determining the concentration of cerium ions in a cerium-doped scintillation crystal. The method comprises the following steps: (a) preparing a cerium-doped scintillation crystal standard product; (b) cutting each standard product prepared in the step (a) accord...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a method for determining the concentration of cerium ions in a cerium-doped scintillation crystal. The method comprises the following steps: (a) preparing a cerium-doped scintillation crystal standard product; (b) cutting each standard product prepared in the step (a) according to the same size and the same crystal orientation; (c) measuring the cutoff wavelength of an ultraviolet-visible transmission spectrum of each standard product cut in the step (b) along the length direction of the crystal; (d) determining the concentration of the cerium ions of each cerium-doped scintillation crystal standard product of each standard product cut in the step (b) by adopting an existing testing method; (e) establishing a standard relation curve between the cutoff wavelength of the ultraviolet-visible transmission spectrum and the concentration of the cerium ions; (f) measuring the cutoff wavelength of the ultraviolet-visible transmission spectrum of same-quality crystal samples to be detected in |
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