METHOD AND SYSTEM FOR PLOTTING DISTRIBUTION OF DATA

In one aspect, a method for displaying measurement information from at least one sensor of a machine is provided. In another aspect, a computing device for displaying measurement information from at least one sensor of a machine is provided. In another aspect, a system for displaying measurement inf...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KEN PAUL CEGLIA, SCOTT TERRELL WILLIAMS
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	In one aspect, a method for displaying measurement information from at least one sensor of a machine is provided. In another aspect, a computing device for displaying measurement information from at least one sensor of a machine is provided. In another aspect, a system for displaying measurement information from at least one sensor of a machine is provided.