Spectrometer, assembling method thereof, and assembling system

The present invention discloses a spectrometer, an assembling method thereof, and an assembling system. The spectrometer comprises a waveguide module, a diffractive component, and a light sensor. The waveguide module has a first reflective surface, a second reflective surface opposite to the first r...

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Bibliographische Detailangaben
Hauptverfasser:	JIAN SHIHONG, CHENG ZHIZHAO, WANG MENGHUA, YE ZHANLIANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	The present invention discloses a spectrometer, an assembling method thereof, and an assembling system. The spectrometer comprises a waveguide module, a diffractive component, and a light sensor. The waveguide module has a first reflective surface, a second reflective surface opposite to the first reflective surface, and a light channel between the first reflective surface and the second reflective surface. The diffractive component has a diffractive surface and a plurality of strip-shaped diffractive structures located on the diffractive surface. The sharpness of the profile of the strip-shaped diffractive structures on a first side of the diffractive surface is greater than that on a second side of the diffractive surface. When viewed along a direction perpendicular to the second reflective surface, the first side of the diffractive surface is positioned between the first reflective surface and the second reflective surface with a distance away from the second reflective surface.