Device for testing reverse recovery time of high-frequency and high-voltage rectifier

A device for testing the reverse recovery time of a high-frequency and high-voltage rectifier belongs to the field of electronic device test. The structure of the device comprises a display part (1), a time interval control part (2), a time and voltage conversion control part (3), a program control...

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Bibliographische Detailangaben
Hauptverfasser: LI JINSHENG, CHEN DONG, XU FAREN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A device for testing the reverse recovery time of a high-frequency and high-voltage rectifier belongs to the field of electronic device test. The structure of the device comprises a display part (1), a time interval control part (2), a time and voltage conversion control part (3), a program control part (4) of a single-chip microcomputer, an inversion control part (5) and a high voltage packet (6). The device is characterized in that a test condition is provided by the high voltage packet, and a reverse recovery time interval is separated out by an integrated circuit U1 with two operational amplifiers; after the time interval is controlled by the single-chip microcomputer, a voltage signal is obtained by an integrated circuit U2 with two operational amplifiers through a constant current charging integral, and the signal is sent to the single-chip microcomputer to be calculated and displayed after voltage-to-frequency conversion. The device has the advantages of stable performance, simplicity in operation, con