Manufacturing management apparatus and manufacturing management system of electronic device

A manufacturing management apparatus and a manufacturing management system of an electronic device are provided. The manufacturing management apparatus uses a database correlating the manufacture condition values of the components of the electronic device with the characteristics of the manufacture factors to generate a model function and to determine a first manufacture condition value. A squared prediction error is measured by using the measurement value of the characteristic that utilizes the determined first manufacture condition value to form the component factors actually. When the squared prediction error is greater than a reference value, the model function is not corrected, but the first manufacture condition value is used as the second manufacture condition value of the following electronic device, and when the squared prediction error is less than the reference value, the database added the actually formed value is used to generate a second model function, and the second manufacture condition value