Method for measuring the light properties of light-emitting diodes

The invention relates to a method for measuring the light properties of light-emitting diodes, concretely to a method for measuring the light properties of light-emitting diodes (LEDs) in an arrangement of a plurality of channels connected in parallel, each having at least one LED per channel and a driver for driving the channels by means of pulse width modulation (PWM), in such a way that at least one pulse of predetermined width can be generated for each channel within a PWM period, wherein the LED of a selected channel is measured during a measurement interval, the measurement interval overlapping a pulse, lying within the PWM period, of a selected channel. According to the invention, in one part of the measurement interval in the PWM period is provided, wherein, another pulse is generated in another channel; the time integral of another channel has index values; in addition, the channel moves in time in a mode out of the measurement interval and meanwhile keeps the index value in the PWM period; or, the c