Method for detecting interference of spatial structures

The invention provides a method for detecting interference of spatial structures. The method includes steps setting a first limiting height for a circuit base board, and respectively setting a plurality of second limiting heights smaller than or equal to the first limiting height for a part of a plu...

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Hauptverfasser: CAO XIANGDUO, YANG JUNYING, WEI ZHIBIN, NI CHONGSHENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a method for detecting interference of spatial structures. The method includes steps setting a first limiting height for a circuit base board, and respectively setting a plurality of second limiting heights smaller than or equal to the first limiting height for a part of a plurality of coordinate areas in the circuit base board; creating Keep-out areas of the circuit base board according to the second limiting heights of the coordinate areas and the first limiting height; comparing heights corresponding to various coordinates in base board accommodating space to the Keep-out areas, and simulating and judging whether conflict can be caused or not when the circuit base board is accommodated in the base board accommodating space. The method has the advantage that by the aid of the method, whether the interference between the circuit base board and the base board accommodating space can occur or not and whether the spatial conflict between the circuit base board and the base board accommoda