Method and system for testing chip digital interface

The invention belongs to the technical field of interface test, and provided a method and system for testing a chip digital interface. The method comprises the steps of receiving test instructions, sending a first digital signal of a corresponding test case to the digital interface of a chip to be t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HU SHENGFA, HUANG JIECHENG, GE BAOJIAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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