Method and system for testing chip digital interface

The invention belongs to the technical field of interface test, and provided a method and system for testing a chip digital interface. The method comprises the steps of receiving test instructions, sending a first digital signal of a corresponding test case to the digital interface of a chip to be tested, receiving a second digital signal output after the first digital signal is transmitted through the digital interface, carrying out comparison on the received second digital signal and the pre-stored first digital signal, outputting a comparison result, and sending out prompt signals representing the fact that the digital interface is normal/abnormal according to the comparison result. Due to the fact that the first digital signal sent to the digital interface in a test process is pre-stored, the first digital signal is sent to the digital interface directly after the test begins, the data correctness of the digital interface on the chip can be identified accurately through the comparison of the second digita