Sample analyzing system, sample analyzer, and management method of sample analyzing system

A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control...

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Bibliographische Detailangaben
Hauptverfasser: YAO SYUNSUKE, NISHIDA TAISUKE, KUWAOKA SHIRO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A sample analyzing system comprising: a first sample analyzer including a first measurement unit for measuring a sample and a first control unit for controlling the first measurement unit; and a second sample analyzer including a second measurement unit for measuring the sample and a second control unit for controlling the second measurement unit; wherein the first control unit is configured to transmit an activation signal for activating the second sample analyzer when a predetermined condition is met for the first sample analyzer; and the second control unit is configured to activate the second sample analyzer when the activation signal is received.