Chemical dry-method etching method and semiconductor device forming method

The invention provides a chemical dry-method etching method and a semiconductor device forming method. The chemical dry-method etching method comprises the following steps that a chemical dry-method etching machine is provided, wherein the chemical dry-method etching machine comprises a quartz glass...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHANG CHENG, BAO ZHONGCHENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ZHANG CHENG
BAO ZHONGCHENG
description The invention provides a chemical dry-method etching method and a semiconductor device forming method. The chemical dry-method etching method comprises the following steps that a chemical dry-method etching machine is provided, wherein the chemical dry-method etching machine comprises a quartz glass tube; the quartz glass tube is subjected to dehydroxylation processing; the chemical dry-method etching machine is used for conducting dry-method etching. According to the chemical dry-method etching method and the semiconductor device forming method, the quartz glass tube in CDE equipment can be prevented from rupturing, and the etching rate and the yield of wafers can be increased.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN103346066A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN103346066A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN103346066A3</originalsourceid><addsrcrecordid>eNrjZPByzkjNzUxOzFFIKarUzU0tychPUUgtSc7IzEtXgHIT81IUikGq8vNSSpNL8osUUlLLMpNTFdLyi3IR6ngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbyzn6GBsbGJmYGZmaMxMWoALa81Ng</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Chemical dry-method etching method and semiconductor device forming method</title><source>esp@cenet</source><creator>ZHANG CHENG ; BAO ZHONGCHENG</creator><creatorcontrib>ZHANG CHENG ; BAO ZHONGCHENG</creatorcontrib><description>The invention provides a chemical dry-method etching method and a semiconductor device forming method. The chemical dry-method etching method comprises the following steps that a chemical dry-method etching machine is provided, wherein the chemical dry-method etching machine comprises a quartz glass tube; the quartz glass tube is subjected to dehydroxylation processing; the chemical dry-method etching machine is used for conducting dry-method etching. According to the chemical dry-method etching method and the semiconductor device forming method, the quartz glass tube in CDE equipment can be prevented from rupturing, and the etching rate and the yield of wafers can be increased.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131009&amp;DB=EPODOC&amp;CC=CN&amp;NR=103346066A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131009&amp;DB=EPODOC&amp;CC=CN&amp;NR=103346066A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG CHENG</creatorcontrib><creatorcontrib>BAO ZHONGCHENG</creatorcontrib><title>Chemical dry-method etching method and semiconductor device forming method</title><description>The invention provides a chemical dry-method etching method and a semiconductor device forming method. The chemical dry-method etching method comprises the following steps that a chemical dry-method etching machine is provided, wherein the chemical dry-method etching machine comprises a quartz glass tube; the quartz glass tube is subjected to dehydroxylation processing; the chemical dry-method etching machine is used for conducting dry-method etching. According to the chemical dry-method etching method and the semiconductor device forming method, the quartz glass tube in CDE equipment can be prevented from rupturing, and the etching rate and the yield of wafers can be increased.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPByzkjNzUxOzFFIKarUzU0tychPUUgtSc7IzEtXgHIT81IUikGq8vNSSpNL8osUUlLLMpNTFdLyi3IR6ngYWNMSc4pTeaE0N4Oim2uIs4duakF-fGpxQWJyal5qSbyzn6GBsbGJmYGZmaMxMWoALa81Ng</recordid><startdate>20131009</startdate><enddate>20131009</enddate><creator>ZHANG CHENG</creator><creator>BAO ZHONGCHENG</creator><scope>EVB</scope></search><sort><creationdate>20131009</creationdate><title>Chemical dry-method etching method and semiconductor device forming method</title><author>ZHANG CHENG ; BAO ZHONGCHENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN103346066A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG CHENG</creatorcontrib><creatorcontrib>BAO ZHONGCHENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG CHENG</au><au>BAO ZHONGCHENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Chemical dry-method etching method and semiconductor device forming method</title><date>2013-10-09</date><risdate>2013</risdate><abstract>The invention provides a chemical dry-method etching method and a semiconductor device forming method. The chemical dry-method etching method comprises the following steps that a chemical dry-method etching machine is provided, wherein the chemical dry-method etching machine comprises a quartz glass tube; the quartz glass tube is subjected to dehydroxylation processing; the chemical dry-method etching machine is used for conducting dry-method etching. According to the chemical dry-method etching method and the semiconductor device forming method, the quartz glass tube in CDE equipment can be prevented from rupturing, and the etching rate and the yield of wafers can be increased.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN103346066A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Chemical dry-method etching method and semiconductor device forming method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T14%3A06%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHANG%20CHENG&rft.date=2013-10-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN103346066A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true