Silicon solar cell surface defect detection and identification method

The invention discloses a silicon solar cell surface defect detection and identification method. The method includes the steps of (1) obtaining an independent canonical variate analysis (ICA) reconstruction disjunct matrix and an independent component; (2) obtaining a solar assembly image reconstruction image to be detected; (3) detecting whether the reconstruction image has defects, and positioning and dividing a defected solar cell piece; (4) obtaining multiple small wave textural features of a solar cell piece surface image to be detected and detecting whether defects exist in a statistic unit; (5) extracting textural features of an independent component element (ICA) of a defected solar cell piece image to be classified; (6) training a support vector machine model; (7) identifying the textural features of a defected solar cell piece image combination to be classified in a classifying mode. The method is easy to operate, can effectively defect fine defects, and improves the detection rate of the defects; r