Image wide line random testing method
The invention provides an image wide line random testing method including selecting a pixel in an image at random as a current pixel, calculating the size of a USAN area of the current pixel by means of WRC if the current pixel is not processed, then judging whether the current pixel is located on a...
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| creator | WANG WEI GAO YINGHUI WANG PING TAN XIANSI WANG JIA QU ZHIGUO YANG BO ZHANG YI WANG HONG FU RUIGANG |
| description | The invention provides an image wide line random testing method including selecting a pixel in an image at random as a current pixel, calculating the size of a USAN area of the current pixel by means of WRC if the current pixel is not processed, then judging whether the current pixel is located on a wide line or at in a homogeneous background area or an area close to the wide line, calculating the direction of the current wide line if the current pixel is located on the wide line , and finding the next current pixel to be processed along the direction. The image wide line random testing method can eliminate redundant calculation amount in a basic USAN wide line testing method, and remarkably improves the calculation speed, and good testing results are obtained. |
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The image wide line random testing method can eliminate redundant calculation amount in a basic USAN wide line testing method, and remarkably improves the calculation speed, and good testing results are obtained.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD1zE1MT1Uoz0xJVcjJzEtVKErMS8nPVShJLS7JzEtXyE0tychP4WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hgbGhpYWJuYmjsbEqAEAHNsm6g</recordid><startdate>20130710</startdate><enddate>20130710</enddate><creator>WANG WEI</creator><creator>GAO YINGHUI</creator><creator>WANG PING</creator><creator>TAN XIANSI</creator><creator>WANG JIA</creator><creator>QU ZHIGUO</creator><creator>YANG BO</creator><creator>ZHANG YI</creator><creator>WANG HONG</creator><creator>FU RUIGANG</creator><scope>EVB</scope></search><sort><creationdate>20130710</creationdate><title>Image wide line random testing method</title><author>WANG WEI ; GAO YINGHUI ; WANG PING ; TAN XIANSI ; WANG JIA ; QU ZHIGUO ; YANG BO ; ZHANG YI ; WANG HONG ; FU RUIGANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN103198474A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2013</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG WEI</creatorcontrib><creatorcontrib>GAO YINGHUI</creatorcontrib><creatorcontrib>WANG PING</creatorcontrib><creatorcontrib>TAN XIANSI</creatorcontrib><creatorcontrib>WANG JIA</creatorcontrib><creatorcontrib>QU ZHIGUO</creatorcontrib><creatorcontrib>YANG BO</creatorcontrib><creatorcontrib>ZHANG YI</creatorcontrib><creatorcontrib>WANG HONG</creatorcontrib><creatorcontrib>FU RUIGANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG WEI</au><au>GAO YINGHUI</au><au>WANG PING</au><au>TAN XIANSI</au><au>WANG JIA</au><au>QU ZHIGUO</au><au>YANG BO</au><au>ZHANG YI</au><au>WANG HONG</au><au>FU RUIGANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Image wide line random testing method</title><date>2013-07-10</date><risdate>2013</risdate><abstract>The invention provides an image wide line random testing method including selecting a pixel in an image at random as a current pixel, calculating the size of a USAN area of the current pixel by means of WRC if the current pixel is not processed, then judging whether the current pixel is located on a wide line or at in a homogeneous background area or an area close to the wide line, calculating the direction of the current wide line if the current pixel is located on the wide line , and finding the next current pixel to be processed along the direction. The image wide line random testing method can eliminate redundant calculation amount in a basic USAN wide line testing method, and remarkably improves the calculation speed, and good testing results are obtained.</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | Image wide line random testing method |
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