Image wide line random testing method

Image wide line random testing method

The invention provides an image wide line random testing method including selecting a pixel in an image at random as a current pixel, calculating the size of a USAN area of the current pixel by means of WRC if the current pixel is not processed, then judging whether the current pixel is located on a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG WEI, GAO YINGHUI, WANG PING, TAN XIANSI, WANG JIA, QU ZHIGUO, YANG BO, ZHANG YI, WANG HONG, FU RUIGANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Beschreibung
Zusammenfassung:The invention provides an image wide line random testing method including selecting a pixel in an image at random as a current pixel, calculating the size of a USAN area of the current pixel by means of WRC if the current pixel is not processed, then judging whether the current pixel is located on a wide line or at in a homogeneous background area or an area close to the wide line, calculating the direction of the current wide line if the current pixel is located on the wide line , and finding the next current pixel to be processed along the direction. The image wide line random testing method can eliminate redundant calculation amount in a basic USAN wide line testing method, and remarkably improves the calculation speed, and good testing results are obtained.