Device for estimating a lifetime of a secondary battery and method thereof

Embodiments of the present invention provide an accelerated lifetime estimation device for predicting the lifetime of a secondary battery, and a method thereof. The accelerated lifetime estimation device can accurately estimate a normal lifetime of the secondary battery while reducing an evaluation...

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Bibliographische Detailangaben
Hauptverfasser:	PARK CHEOL-HO, SUH SEUNG-BUM, JUNG IN-HO, CHEONG KYEONG-BEOM, LEE JANG-WOO, KIM YONG-SIC, KO YOUNG-HWA, KIM WON-SEOK, SHIN JEONG-SOON, YANG SEUNG-HO, CHAI HEE-KWAN, SONG JOO-HAN, BAEG KWANG-KI, JOUNG BOUNG-GUN, LEE SU-DONG, BAEK HO-YUL, KIM JAKE, KIM JONG-MAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Embodiments of the present invention provide an accelerated lifetime estimation device for predicting the lifetime of a secondary battery, and a method thereof. The accelerated lifetime estimation device can accurately estimate a normal lifetime of the secondary battery while reducing an evaluation time period of the secondary battery.