Frequency-shift super-resolution microimaging method and device based on evanescent field illumination
The invention discloses a frequency-shift super-resolution microimaging method based on evanescent field illumination. The method comprises the steps that 1) incident illumination light obliquely irradiates a substrate medium interface, is totally reflected and generates an evanescent field; 2) the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a frequency-shift super-resolution microimaging method based on evanescent field illumination. The method comprises the steps that 1) incident illumination light obliquely irradiates a substrate medium interface, is totally reflected and generates an evanescent field; 2) the evanescent field is used for illuminating the surface of a sample; a strength image of the surface of the sample is received by a microscope; 3) the strength image is subjected to Fourier transformation; a corresponding frequency spectrum is obtained and is restored; a corresponding frequency spectrum restoring image is obtained; 4) the direction of the incident illumination light is changed for many times around the sample till the direction of the incident illumination light covers 0-360 DEG; frequency spectrum restoring images in different directions are obtained; 5) the frequency spectrum restoring images in the different directions are stacked; a complete high frequency spectrum image is obtained; and 6) the c |
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