Limit mold for back lapping of infrared focal plane detector and preparation method

Bibliographische Detailangaben

Hauptverfasser:	HE GAOYIN, WU TINGQI, WANG JIANXIN, YANG YONGBIN, WU YUN, ZHONG YANHONG, LIAO QINGJUN, CAO JUYING, YU JUN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PERFORMING OPERATIONS SEMICONDUCTOR DEVICES TRANSPORTING WORKING CEMENT, CLAY, OR STONE WORKING STONE OR STONE-LIKE MATERIALS
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