Automatic inductance-capacitance calibrating method and circuit

The invention relates to the field of communication and discloses an automatic inductance-capacitance calibrating method and circuit. The automatic inductance-capacitance calibrating method comprises the following steps: detecting the signal intensity of corresponding direct current offset when a ca...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CUI FULIANG, LI HAISONG, ZHOU MINXIN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the field of communication and discloses an automatic inductance-capacitance calibrating method and circuit. The automatic inductance-capacitance calibrating method comprises the following steps: detecting the signal intensity of corresponding direct current offset when a capacitor array in the inductance and capacitance has different values till the signal intensity of the found direct current offset is maximum, and calibrating the capacitor array in the LC (Inductance-Capacitance) according to the value of the capacitor array corresponding maximum. The LC deviation is achieved by adjusting the value of the capacitor array, so that the working performance and the yield of chips can be improved efficiently, the requirement for mass production can be met, LC technical compensating calibration can be automatically and quickly realized at high precision; and an off-chip SAW (Surface Acoustic Wave) filter is not required, so that the cost is efficiently controlled.