System and method for inspection of electrical circuits
A system for inspection of electrical circuits including a defect detection subsystem and an addition subsystem operative except a detection period to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various d...
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| Hauptverfasser: | , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Online-Zugang: | Volltext bestellen |
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| Zusammenfassung: | A system for inspection of electrical circuits including a defect detection subsystem and an addition subsystem operative except a detection period to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein. |
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