Method and device for detecting x ray quantum

The invention refers to a method and device for detecting X ray quantum. The X ray quantum is generated in an X ray pipe and incomes into a multi pixel X ray detector (4) of a two-dimensional matrix (10) formed by pixels (P) for generating measuring signals, wherein in a prescribed time measuring si...

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Bibliographische Detailangaben
Hauptverfasser:	SCHULZ REINER FRANZ, SHANNEIK KAISS
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	GAMMA RAY OR X-RAY MICROSCOPES IRRADIATION DEVICES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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Beschreibung
Zusammenfassung:	The invention refers to a method and device for detecting X ray quantum. The X ray quantum is generated in an X ray pipe and incomes into a multi pixel X ray detector (4) of a two-dimensional matrix (10) formed by pixels (P) for generating measuring signals, wherein in a prescribed time measuring signals are generated and continuous and concentrated pixels (P) formed by a plurality of pixels (P) are distributed to an event set (EC) by an analyzing unit (6), wherein the measuring signals are introduced to be used for the approximation of the position as follows and at the position the X ray quantum and the multi pixel X ray detector (4) are influenced mutually.