Method for measuring radius of curvature of spherical surface
The invention relates to a method for measuring the radius of curvature of a spherical surface. According to the method, a reference substance (2) of which the size is a is coaxial with a microscope objective (3), and the distance between the reference substance (2) and the vertex of a measured sphe...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention relates to a method for measuring the radius of curvature of a spherical surface. According to the method, a reference substance (2) of which the size is a is coaxial with a microscope objective (3), and the distance between the reference substance (2) and the vertex of a measured spherical surface (4) is L, wherein L can be changed independently in the axial direction; the reference substance (2) is reflected by the measured spherical surface on an object carrying platform (5) to form an image (6) of which the size is b, the image (6) is subjected to microscopic amplification by a microscope system to form an image (7) of which the size is c, and the image (7) is acquired by a charge coupled device (CCD) camera arranged on a microscope ocular lens (1) and is stored in a computer. The radius of curvature r of the measured spherical surface can be expressed by a function which contains the parameters of a, c and L, wherein a and L are measured directly, and c is measured by utilizing computer sof |
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