Method for improving degree of detail recognition in x-ray images

The present invention relates to a method for improving the degree of detail recognition in X-ray images. The method involves producing a positive X-ray image of an object (6) using an X-ray testing device (1), wherein the X-ray image is divided into an empty area (9) and an object area (10). A dark...

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Bibliographische Detailangaben
1. Verfasser:	HENKEL RAINER
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a method for improving the degree of detail recognition in X-ray images. The method involves producing a positive X-ray image of an object (6) using an X-ray testing device (1), wherein the X-ray image is divided into an empty area (9) and an object area (10). A darkening processing is performed on the empty area (9) of the X-ray image.